Intelligent Defect Inspection Device Powered by Computer Vision and Deep Learning
Quality control has been a key factor in manufacturing since Henry Ford first introduced the assembly line system.
MERASYS propose the NASIR devices for automated optical inspection (AOI), powered by machine vision. The new types of AOI systems are equipped with multi-cameras ranging from simple XGA (Extended Graphics Array) units to high-resolution, multiple-megapixel video sensors. Depending on the camera type, an AOI system can either provide monochrome or colour images of the inspected items, and the captured images can span a wide range, from mere thousands of data points to millions of data points.